Eclipse L300N Series – FPD/LSI inspection microscopes

Featuring Nikon's most advanced optics for unparalleled inspection of the latest wafer types.
Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays.

Applications

  • Antennae
  • Telecom & Electronics
  • Telescope optics
  • Mobile phones, shavers & watches

 

Contact us for configuations and pricing

Nikon Eclipse L300N Series Microscope

7536 West Murray Drive

Cicero, NY 13039

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